Scaling relations and universality in electrical failure processes of thin films: is it possible to predict failure times?

✍ Scribed by C Pennetta; L Reggiani; Gy Trefán

• Book ID: 117626580
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 104 KB
• Volume: 22
• Category: Article
• ISSN: 0927-0256
• DOI: 10.1016/s0927-0256(01)00156-2