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Scaling issues related to high field phenomena in submicrometer MOSFET's

✍ Scribed by Sangiorgi, E.; Hofstatter, E.A.; Smith, R.K.; Bechtold, P.F.; Fichtner, W.


Book ID
120639862
Publisher
IEEE
Year
1986
Tongue
English
Weight
345 KB
Volume
7
Category
Article
ISSN
0741-3106

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