Input capacitance scaling related to short-channel noise phenomena in MOSFET's

✍ Scribed by Birbas, A.N.; Triantis, D.P.; Plevridis, S.E.; Tsakas, E.F.

• Book ID: 114537755
• Publisher: IEEE
• Year: 1999
• Tongue: English
• Weight: 143 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.766894