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Scaling and technological limitations of 1/f noise and oscillator phase noise in SiGe HBTs

โœ Scribed by Guofu Niu; Jin Tang; Zhiming Feng; Joseph, A.J.; Harame, D.L.


Book ID
114660221
Publisher
IEEE
Year
2005
Tongue
English
Weight
625 KB
Volume
53
Category
Article
ISSN
0018-9480

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