<p><P>Functional verification has become an important aspect of the chip design process. Significant resources, both in industry and academia, are devoted to the design complexity and verification endeavors.</P><P></P><P><EM>SAT-Based Scalable Formal Verification</EM> Solutions discusses in detail s
SAT-Based Scalable Formal Verification Solutions (Series on Integrated Circuits and Systems)
β Scribed by Malay Ganai, Aarti Gupta
- Year
- 2007
- Tongue
- English
- Leaves
- 338
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
This book provides an engineering insight into how to provide a scalable and robust verification solution with ever increasing design complexity and sizes. It describes SAT-based model checking approaches and gives engineering details on what makes model checking practical. The book brings together the various SAT-based scalable emerging technologies and techniques covered can be synergistically combined into a scalable solution.
π SIMILAR VOLUMES
<P>Functional verification has become an important aspect of the chip design process. Significant resources, both in industry and academia, are devoted to the design complexity and verification endeavors.</P> <P></P> <P><EM>SAT-Based Scalable Formal Verification Solutions</EM> discusses in detail
Lately, there has been a growing interest in exploiting the benefits of the ICs for areas outside of the traditional application spaces. One noteable area is found in biologyΒ Bioanalytical instruments have been miniaturized on ICs to study various biophenomena or to actuate biosystems. These biolab
<p>Semiconductor Device Physics and Design teaches readers how to approach device design from the point of view of someone who wants to improve devices and can see the opportunity and challenges. It begins with coverage of basic physics concepts, including the physics behind polar heterostructures a
<p><span>Semiconductor Device Physics and Design</span><span> provides a fresh and unique teaching tool. Over the last decade device performances are driven by new materials, scaling, heterostructures and new device concepts. Semiconductor devices have mostly relied on Si but increasingly GaAs, InGa
This volume provides a complete understanding of the fundamental causes of routing congestion in present-day and next-generation VLSI circuits, offers techniques for estimating and relieving congestion, and provides a critical analysis of the accuracy and effectiveness of these techniques. The book