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Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy

✍ Scribed by M. Kasrai; W.N. Lennard; R.W. Brunner; G.M. Bancroft; J.A. Bardwell; K.H. Tan

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 909 KB
Volume: 99
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(96)00454-0

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