Si K-edge and Ge K-edge X-ray absorption spectroscopy of the Si-Ge interface in [(Si)m(Ge)n]p atomic layer superlattices

✍ Scribed by A.P. Hitchcock; T. Tyliszczak; P. Aebi; J.Z. Xiong; T.K. Sham; K.M. Baines; K.A. Mueller; X.H. Feng; J.M. Chen; B.X. Yang; Z.H. Lu; J.-M. Baribeau; T.E. Jackman

• Publisher: Elsevier Science
• Year: 1993
• Weight: 68 KB
• Volume: 291
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(93)90320-i