Infrared Study of Hydrogen in Ultra-Thin
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Olivier, M. ;Martin, F. ;Chabli, A. ;Lefeuvre, G. ;Conne, F. ;Rochat, N.
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Article
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1999
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John Wiley and Sons
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English
⚖ 191 KB
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We discuss the usefulness of the two-prism coupling geometry to perform non-destructive multiple internal reflection (MIR) measurements on 200 mm silicon wafers. Application to the determination of the Si±H and N±H bond concentrations in LPCVD SiN ultra-thin films, is presented. It is shown that an