S-Parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties

✍ Scribed by J. Hinojosa; L. Faucon; P. Queffelec; F. Huret

• Publisher: John Wiley and Sons
• Year: 2001
• Tongue: English
• Weight: 203 KB
• Volume: 30
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.1222

✦ Synopsis

Abstract

A measurement technique for the broadband determination of the complex permittivity and permeability of isotropic film‐shaped materials is presented. ε~r~ and μ~r~ are computed from S‐parameter measurements of microstrip lines propagating in the dominant mode and used as cells. The material under test is the microstrip‐line substrate, which is the original feature of this method in comparison with existing techniques. This leads to a simple and reproducible measurement process. Measurements for several materials in the 0.05–40 GHz frequency range show good agreement between measured and predicted data. © 2001 John Wiley & Sons, Inc. Microwave Opt Technol Lett 30: 65–69, 2001.