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S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

✍ Scribed by Hinojosa, J.

Book ID: 120579857
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 88 KB
Volume: 11
Category: Article
ISSN: 1531-1309
DOI: 10.1109/7260.933779

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## Abstract A measurement technique for the broadband determination of the complex permittivity and permeability of isotropic film‐shaped materials is presented. ε~__r__~ and μ~__r__~ are computed from __S__‐parameter measurements of microstrip lines propagating in the dominant mode and used as cel