S-parameter-based IC interconnect transmission line characterization : William R. Eisenstadt and Yungseon Eo. IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 15(4), 483 (1992)

• Book ID: 103285328
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 111 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90445-5