S-matrix approach for description of refraction and absorption effects in9Be elastic scattering
β Scribed by Y. A. Berezhnoy; V. V. Pilipenko
- Book ID
- 112981320
- Publisher
- Springer-Verlag
- Year
- 1996
- Tongue
- English
- Weight
- 482 KB
- Volume
- 3
- Category
- Article
- ISSN
- 1219-7580
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π SIMILAR VOLUMES
We deΓne a new parameter to describe the e β ects of elastic electron scattering in XPS and AES. The parameter is the ratio of emitted intensity from a layer of atoms located at a given depth in a solid calculated from theories that take into account and neglect elastic electron scattering. We have f
Elastic electron scattering in XPS and AES vary considerably with depth of origin of emitted electrons. To account for this, we introduced in a recent paper a simple correction factor CF. The function CF is the ratio of emitted peak intensity from a layer of atoms located at a given depth in a solid