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Roughness conformity during tungsten film growth: An in situ synchrotron x-ray scattering study

✍ Scribed by Peverini, Luca; Ziegler, Eric; Bigault, Thierry; Kozhevnikov, Igor


Book ID
120032984
Publisher
The American Physical Society
Year
2005
Tongue
English
Weight
611 KB
Volume
72
Category
Article
ISSN
1098-0121

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