Comparison between βintermediateβ- and β
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A. Claverie; C. Vieu; J. FaurΓ©; J. Beauvillain
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Article
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1989
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Elsevier Science
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English
β 541 KB
## Cross-sectional electron microscopy and related diffraction techniques have been applied to the characterization of argon-and xenon-bombardment-induced amorphization of silicon at room temperature. "Damage" calculations have been performed to provide a theoretical support to the observations. Com