Complex superstructure patterns near def
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L. Tapasztó; P. Nemes-Incze; Z. Osváth; M.C. Bein; Al. Darabont; L.P. Biró
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Article
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2008
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Elsevier Science
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English
⚖ 770 KB
Atomic resolution scanning tunneling microscope (STM) images of native and artificially created defect sites on graphite and carbon nanotubes were compared. The presence of position-dependent coexisting superstructure patterns was identified on all of the investigated samples. The results indicate t