Role of Interface Layers and Localized States in TiAl-Based Ohmic Contacts top-Type 4H-SiC

✍ Scribed by M. Gao; S. Tsukimoto; S.H. Goss; S.P. Tumakha; T. Onishi; M. Murakami; L.J. Brillson

• Book ID: 107453591
• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 1010 KB
• Volume: 36
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-006-0078-0