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RIT Munsell Color Science Laboratory offers annual industrial short course : Essentials of color science June 3–6, 2008

Publisher
John Wiley and Sons
Year
2007
Tongue
English
Weight
500 KB
Volume
33
Category
Article
ISSN
0361-2317

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RIT Munsell Color Science Laboratory offers annual industrial short course “Essentials of Color Science”
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In this work, a procedure is described to estimate the CIE tristimulus values of Munsell color chips under new illuminants from CIE tristimulus values under specific illuminant. The estimation was performed by multiple linear regression (MLR) and principal component analysis (PCA) techniques. In add

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will focus on the applications of colorimetry for industrial color control of materials. Key topics include spectrophotometry: principles, geometry selection, and methods of characterizing precision and accuracy; CIE colorimetry: derivation of colorimetry from XYZ through CIELAB; and tolerancing: CM