Munsell Color Science Laboratory offers industrial short courses
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 14 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0361-2317
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β¦ Synopsis
will focus on the applications of colorimetry for industrial color control of materials. Key topics include spectrophotometry: principles, geometry selection, and methods of characterizing precision and accuracy; CIE colorimetry: derivation of colorimetry from XYZ through CIELAB; and tolerancing: CMC and CIE94 equations, deriving visual tolerances from historical pass/fail data, and optimizing l:c ratios.
π SIMILAR VOLUMES
In this work, a procedure is described to estimate the CIE tristimulus values of Munsell color chips under new illuminants from CIE tristimulus values under specific illuminant. The estimation was performed by multiple linear regression (MLR) and principal component analysis (PCA) techniques. In add