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Rietveld refinement of the semiconducting system Bi2−xFexTe3 from X-ray powder diffraction

✍ Scribed by Alia Adam

Book ID: 113786116
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 934 KB
Volume: 42
Category: Article
ISSN: 0025-5408
DOI: 10.1016/j.materresbull.2007.02.027

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