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Rietveld refinement of the semiconducting compound CdGaCrS4 from X-ray powder diffraction

✍ Scribed by Delgado, Gerzon E. ;Mora, Asiloé J. ;Betancourt, Luis ;Sagredo, Vicente

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
122 KB
Volume
199
Category
Article
ISSN
0031-8965

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Crystal structure refinement of the ternary compound Cu2SnTe3 by X-ray powder diffraction
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The ternary compound Cu 2 SnTe 3 crystallizes in the Imm2 (Nº 44) space group, Z = 2, with a = 12.833(4) Å, b = 4.274(1) Å, c = 6.043(1) Å, V = 331.5(1) Å 3 . Its structure was refined from X-ray powder diffraction data using the Rietveld method. The refinement of 25 instrumental and structural vari