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RF Testing on a Mixed Signal Tester

โœ Scribed by Dana Brown; John Ferrario; Randy Wolf; Jing Li; Jayendra Bhagat; Mustapha Slamani


Publisher
Springer US
Year
2007
Tongue
English
Weight
289 KB
Volume
23
Category
Article
ISSN
0923-8174

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Owing to the analogue nature of many industrial processes and the increasing use of microprocessor techniques, many circuits nowadays carry mixed (digital and analogue) signals. As complexities of these circuits increase, the testability of mixed-signal circuits has become an important issue that mu