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Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores

✍ Scribed by Carsten Wegener; Heinz Mattes; Stephane Kirmser; Frank Demmerle; Sebastian Sattler


Publisher
Springer US
Year
2009
Tongue
English
Weight
256 KB
Volume
25
Category
Article
ISSN
0923-8174

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