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Rf-sputtering growth of stoichiometric amorphous TeO2 thin films

โœ Scribed by M. Di Giulio; A. Zappettini; L. Nasi; S. M. Pietralunga


Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
146 KB
Volume
40
Category
Article
ISSN
0232-1300

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Stoichiometric growth of polycrystalline
โœ Yin-an Li; Ze-bo Zhang; Si-shen Xie; Guo-zhen Yang ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 209 KB

Polycrystalline carbon nitride films were synthesized using the rf diode sputtering technique. The carbon nitride films were evaluated with IR spectroscopy, X-ray diffraction and Auger electron spectroscopy. The more important findings are that polycrystalline C3N 4 films could be deposited on singl