✦ LIBER ✦

RF characterization of CMOS and BiCMOS advanced technologies at wafer level

✍ Scribed by J.L. Carbonero

Book ID: 104306505
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 1019 KB
Volume: 40
Category: Article
ISSN: 0167-9317
DOI: 10.1016/s0167-9317(98)00271-8

No coin nor oath required. For personal study only.

✦ Synopsis

The continuous growth of radiofrequency (RF) telecommunication market offers considerable possibilities to Silicon CMOS/BiCMOS technologies which become competitive with respect to GaAs MESFETs. Therefore, there is a strong need for RF characterization of such technologies in industrial R&D laboratories. This lecture will thus propose a detailed description of the methodologies and experimental procedures required for RF measurements of S-parameters and high frequency noise at wafer level.

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