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RF characterization and isolation properties of mesoporous Si by on-chip coplanar waveguide measurements

✍ Scribed by H. Contopanagos; F. Zacharatos; A.G. Nassiopoulou

Book ID: 108271690
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 439 KB
Volume: 52
Category: Article
ISSN: 0038-1101
DOI: 10.1016/j.sse.2008.06.044

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