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[IEEE 2013 IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Kuala Lumpur, Malaysia (2013.11.25-2013.11.27)] 2013 IEEE International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA) - Structural properties of nanorod zinc oxide thin films on Si substrate deposited by RF magnetron sputtering at room temperature

✍ Scribed by Shafura, A. K.; Sin, N. D. Md; Mamat, M. H.; Uzer, M; Mohamad, A.; Rusop, M.

Book ID: 125469311
Publisher: IEEE
Year: 2013
Weight: 521 KB
Category: Article
ISBN: 1479908428
DOI: 10.1109/icsima.2013.6717947

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