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Review of semiconductor drift detectors

✍ Scribed by Emilio Gatti; Pavel Rehak

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
627 KB
Volume
541
Category
Article
ISSN
0168-9002

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Recent technological developments and new topology designs have made semiconductor drift detectors ideal devices for high-resolution x-ray spectrometry. In this paper the basic topology of a semiconductor drift detector with on-chip electronics specially designed for x-ray spectrometry is reviewed.