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RETRACTED: Interactions between planar defects in bulk 3C-SiC

✍ Scribed by Ikebe, Yohei; Nagasawa, Hiroyuki; Hatta, Naoki; Kawahara, Takamitsu; Yagi, Kuniaki

Book ID: 123346434
Publisher: Elsevier Science
Year: 2014
Tongue: English
Weight: 62 KB
Volume: 389
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2013.12.003

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