Restoration and pictorial representation of scanning-tunneling-microscope data
β Scribed by E. Stoll; A. Baratoff
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 821 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0304-3991
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
We have observed scanning tunneling microscope light emission (STM-LE) spectra of Ge 2 Sb 2 Te 5 and Sb 2 Te 3 . Although these chalcogenide alloys exhibit band gaps less than 0.5 eV, the STM-LE was observed with a narrow spectral width at a photon energy of 1.5 eV for both materials. By analyzing i
In the present study we use the Scanning Wneling Microscope (STM) as an instrument to investigate the photovoltaic properties of semiconducting materials. The surfaces of the layered semiconductor WSe, were optically illuminated during the tunneling process. The resulting photo-induced tunneling cur