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Response of the surface dielectric function to dynamic surface modifications: application of reflectance anisotropy spectroscopy and spectroscopic ellipsometry

✍ Scribed by J.-T. Zettler; M. Pristovsek; T. Trepk; A. Shkrebtii; E. Steimetz; M. Zorn; W. Richter

No coin nor oath required. For personal study only.

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