✦ LIBER ✦
Application of UV-VIS and FTIR Spectroscopic Ellipsometry to the Characterization of Wet-Chemically Treated Si Surfaces
✍ Scribed by Henrion, W. ;Röseler, A. ;Angermann, H. ;Rebien, M.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 225 KB
- Volume
- 175
- Category
- Article
- ISSN
- 0031-8965
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