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Resonance ionization mass spectrometry of AlxGa_1−xAs: depth resolution, sensitivity, and matrix effects

✍ Scribed by Downey, S. W. ;Kopf, R. F. ;Schubert, E. F. ;Kuo, J. M.

Book ID: 115341201
Publisher: The Optical Society
Year: 1990
Tongue: English
Weight: 669 KB
Volume: 29
Category: Article
ISSN: 1559-128X
DOI: 10.1364/AO.29.004938

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