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Resolution limits of microscopy through scattering layers

✍ Scribed by M. Kempe; A. Thon; W. Rudolph

Book ID
103325263
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
462 KB
Volume
110
Category
Article
ISSN
0030-4018

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## Abstract Calculated and measured resolution figures are presented for confocal microscopes with different pinhole sizes and for nonlinear (2‐photon and second harmonic) microscopes. A modest degree of super‐resolution is predicted for a confocal microscope but in practice this is not achievable