Residual stress measurement of an EB-PVD Y2O3-ZrO2 thermal barrier coating by micro-Raman spectroscopy
β Scribed by M. Tanaka; R. Kitazawa; T. Tomimatsu; Y.F. Liu; Y. Kagawa
- Book ID
- 108278579
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 295 KB
- Volume
- 204
- Category
- Article
- ISSN
- 0257-8972
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The effect of multilayer configurations on the thermal conductivity of 4 mol% Y 2 O 3 -stabilized ZrO 2 coatings fabricated by EB-PVD has been investigated. The deposited coating layers consist of columnar grains containing nano-sized pores. Multilayer specimens are found to contain many pores at th
By using specially designed freestanding 8 wt.% Y 2 O 3 stabilized ZrO 2 (8YSZ) specimens, a linear relationship is found between the Raman peak shift, ΞΟ, and applied uniaxial compressive stress, ΟΜ u , i.e., ΞΟ = Ξ u ΟΜ u with Ξ u being the piezo-spectroscopic coefficient. The linear relationship