Effects of piezo-spectroscopic coefficients of 8 wt.% Y2O3 stabilized ZrO2 on residual stress measurement of thermal barrier coatings by Raman spectroscopy
β Scribed by W.G. Mao; Q. Chen; C.Y. Dai; L. Yang; Y.C. Zhou; C. Lu
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 723 KB
- Volume
- 204
- Category
- Article
- ISSN
- 0257-8972
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β¦ Synopsis
By using specially designed freestanding 8 wt.% Y 2 O 3 stabilized ZrO 2 (8YSZ) specimens, a linear relationship is found between the Raman peak shift, ΞΟ, and applied uniaxial compressive stress, ΟΜ u , i.e., ΞΟ = Ξ u ΟΜ u with Ξ u being the piezo-spectroscopic coefficient. The linear relationship is used to determine the in-plane residual stress in air plasma-sprayed 8YSZ thermal barrier coatings (TBCs). It is shown that the Ξ u of the 8YSZ is an exponential function of the thermal cycle N for a given thermal cycling process: Ξ u = 37.6exp (-N/25.9) + 13. Based on these two relationships, the actual residual stress of 8YSZ TBCs determined by the Raman spectroscopy method is quantitatively consistent with that obtained by the X-ray diffraction.
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