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Residual stress and damage effect on integrity of ground silicon nitride

✍ Scribed by R. W. Monahan; Bi Zhang; Fulun Yang; Jiexin Wang; Zhenqi Zhu


Book ID
111536269
Publisher
Springer
Year
2000
Tongue
English
Weight
852 KB
Volume
35
Category
Article
ISSN
0022-2461

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