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Research on the Size of Defects inside RDX/HMX Crystal and Shock Sensitivity

✍ Scribed by Hua, Cheng; Zhang, Pan-Jun; Lu, Xiao-Jun; Huang, Ming; Dai, Bin; Fu, Hua


Book ID
121744372
Publisher
John Wiley and Sons
Year
2013
Tongue
English
Weight
892 KB
Volume
38
Category
Article
ISSN
0721-3115

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