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On the Reliability of Sensitivity Test Methods for Submicrometer-Sized RDX and HMX Particles

✍ Scribed by Radacsi, Norbert; Bouma, Richard H. B.; Krabbendam-la Haye, Ellen L. M.; ter Horst, Joop H.; Stankiewicz, Andrzej I.; van der Heijden, Antoine E. D. M.


Book ID
127053770
Publisher
John Wiley and Sons
Year
2013
Tongue
English
Weight
618 KB
Volume
38
Category
Article
ISSN
0721-3115

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