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Research on edge identification of a defect using pulsed eddy current based on principal component analysis

✍ Scribed by Yang BinFeng; Luo FeiLu; Han Dan

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 524 KB
Volume: 40
Category: Article
ISSN: 0963-8695
DOI: 10.1016/j.ndteint.2006.12.005

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