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Defect detection and evaluation using a computer controlled pulsed eddy current test equipment : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands) 23–28 Apr. 1989, Vol. 1, pp. 305–310. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989

✍ Scribed by P. Weber; Y. Jayet; F. Pons

Publisher: Elsevier Science
Year: 1990
Weight: 166 KB
Volume: 23
Category: Article
ISSN: 0308-9126
DOI: 10.1016/0308-9126(90)90945-k

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