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Removing multiple redundancies in combinational circuits

✍ Scribed by Shih-Chieh Chang; Cheng, D.I.; Ching-Wei Yeh


Book ID
114448498
Publisher
The Institution of Electrical Engineers
Year
2002
Tongue
English
Weight
177 KB
Volume
149
Category
Article
ISSN
1350-2387

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## Abstract This paper proposes a method for efficiently removing redundant elements using properties of undetectable faults obtained by test pattern generation. Lines of redundant elements have undetectable single stuck‐at faults. We classify undetectable faults into three categories according to