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Reliability testing of flexible printed circuit-based RF MEMS capacitive switches

✍ Scribed by Simone Lee; Ramesh Ramadoss; Michael Buck; V.M. Bright; K.C. Gupta; Y.C. Lee

Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 549 KB
Volume: 44
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2003.09.002

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