Reliability Study of Phase-Change Nonvolatile Memories

✍ Scribed by Pirovano, A.; Redaelli, A.; Pellizzer, F.; Ottogalli, F.; Tosi, M.; Ielmini, D.; Lacaita, A.L.; Bez, R.

• Book ID: 120078291
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 604 KB
• Volume: 4
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/TDMR.2004.836724