High temperature reliability of μtrench Phase-Change Memory devices

✍ Scribed by G. Navarro; S. Souiki; A. Persico; V. Sousa; J.-F. Nodin; C. Jahan; F. Aussenac; V. Delaye; O. Cueto; L. Perniola; B. De Salvo

• Book ID: 119326674
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 678 KB
• Volume: 52
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2012.06.017