𝔖 Bobbio Scriptorium

✦ LIBER ✦

Reliability study of a high precision thick film resistor network : Y. Nakada and T. L. Schock. Proc. Electron. Components Conf. Arlington, Va., (May 16–18 1977). p. 103

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 127 KB
Volume: 17
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90685-6

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