Reliability studies on NPN RF power transistors under swift heavy ion irradiation

✍ Scribed by N. Pushpa; K.C. Praveen; A.P. Gnana Prakash; P.S. Naik; John D. Cressler; S.K. Gupta; D. Revannasiddaiah

• Book ID: 113823553
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 441 KB
• Volume: 273
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2011.07.032