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Reliability of the band discontinuity determination by capacitance-voltage method: Relation of the interface charge density and the trap concentration near the interface

✍ Scribed by H. Okumura; S. Misawa; S. Yoshida

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Reliability of the band discontinuity de

✍ H. Okumura; S. Misawa; S. Yoshida 📂 Article 📅 1986 🏛 Elsevier Science ⚖ 40 KB

Technical Method of Determination of the

✍ Jakubowski, A. ;Iniewski, K. 📂 Article 📅 1985 🏛 John Wiley and Sons 🌐 English ⚖ 329 KB

High frequency capacitance-voltage techn

✍ Deen, David A.; Champlain, James G. 📂 Article 📅 2011 🏛 American Institute of Physics 🌐 English ⚖ 597 KB

Simple Method for Determination of the I

✍ Jakubowski, A. ;Iniewski, K. 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 234 KB

Separation of interface and nonuniform o

✍ Kavalieros, J.T.; Chih-Tang Sah 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 620 KB

Determination of the density of Si-metal

✍ Abdulmecit Türüt; Mustafa Saǧlam 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 501 KB