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Reliability of RF MEMS switches due to charging effects and their circuital modelling

✍ Scribed by Romolo Marcelli; Giancarlo Bartolucci; George Papaioannu; Giorgio De Angelis; Andrea Lucibello; Emanuela Proietti; Benno Margesin; Flavio Giacomozzi; François Deborgies

Book ID: 106185873
Publisher: Springer-Verlag
Year: 2010
Tongue: English
Weight: 602 KB
Volume: 16
Category: Article
ISSN: 0946-7076
DOI: 10.1007/s00542-009-1006-z

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