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Reliability of results obtained in measuring the minority charge carrier lifetime in semiconductors by the PEM effect method

โœ Scribed by T. B. Viryasova; V. S. Garnyk; A. V. Naumov; V. D. Isaikin; M. R. Raukhman; N. N. Kiseleva


Publisher
Springer US
Year
1993
Tongue
English
Weight
295 KB
Volume
36
Category
Article
ISSN
0543-1972

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