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Reliability of power GaAs field-effect transistors

✍ Scribed by Fukui, H.; Wemple, S.H.; Irvin, J.C.; Niehaus, W.C.; Hwang, J.C.M.; Cox, H.M.; Schlosser, W.O.; DiLorenzo, J.V.

Book ID: 114594036
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 875 KB
Volume: 29
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1982.20714

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